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Intends to provide a fundamental understanding of the extended-defect formation during Ge materials and device processing, providing ways to distinguish harmful from less detrimental defects and should point out ways for defect engineering and control. Additional Details
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BOOK TYPE : NF
BRAND : Claeys, Cor/ Simoen, Eddy
DEWEY CLASSIFICATION : 535
LANGUAGE : ENGLISH
NUMBER OF PAGES : 297
PUBLISH DATE : 2009/03/06
PUBLISHER IMPRINT CODE : SPRIV
PUBLISHER NAME : SPRINGER VERLAG
RETURNS ACCEPTED? : YES
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